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Contents
Front Matter
Introduction
1.
Rutherford Back Scattering (RBS)
2.
Backscattering Spectroscopy : Rutherford Back Scattering
3.
Rutherford Back Scattering -III
4.
Formulation of SHG using Classical Harmonic Oscillator (MSC)
5.
Rutherford Back Scattering - IV
6.
X-ray Photoelectron Spectroscopy - 2
7.
Auger electron Spectroscopy - 1
8.
Auger Electron Microscopy-2
9.
Rutherford Back Scattering - III
10.
Low Voltage Surface Electron Microscopy
11.
Energy Dispersive X-Ray Spectroscopy
12.
Electron Beam Lithography - I
13.
Electron Beam Lithography - II
14.
Atomic Force Microscopy-I
15.
Atomic Force Microscopy-II
16.
Second Harmonic Generation and Phase Matching
17.
Birefringence
18.
Scanning Electron Microscopy
19.
Characterization of Fluorescence Emission
20.
Fluorescence Quantum Yield and Lifetime
21.
Instrumentation for Fluorescence Spectroscopy
22.
Introduction to Nonlinear Optics
23.
Formulation of Nonlinear Optics
24.
Formulation of SHG using Classical Harmonic Oscillator
Back Matter
Appendix
Characterization Techniques for Materials II
Introduction
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